6800 search results - page 219 / 1360 » Testing with Functions as Specifications |
120
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SNPD
2003
15 years 5 months ago
2003
We present our experience in automatically deriving a detailed test case plan exclusively using the UML diagrams developed during the analysis and design phases. We consider in pa...
150
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DSN
2000
IEEE
15 years 8 months ago
2000
IEEE
Although Microsoft Windows is being deployed in mission-critical applications, little quantitative data has been published about its robustness. We present the results of executin...
113
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
130
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ATS
2000
IEEE
15 years 8 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
116
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ITC
1996
IEEE
15 years 8 months ago
1996
IEEE
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...