6800 search results - page 244 / 1360 » Testing with Functions as Specifications |
125
Voted
ATS
2003
IEEE
15 years 10 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
148
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VTS
2002
IEEE
15 years 10 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
179
Voted
DSRT
2008
IEEE
15 years 6 months ago
2008
IEEE
The complexity and the variety of the deployed timedependent systems, as well as the high degree of reliability required for their global functioning, justify the care provided to...
139
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CORR
2011
Springer
15 years 2 days ago
2011
Springer
—This paper studies the problem of high-dimensional multiple testing and sparse recovery from the perspective of sequential analysis. In this setting, the probability of error is...
134
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ICFEM
2009
Springer
15 years 11 months ago
2009
Springer
In this paper we describe the functional features and the architecture of a tool implementing the Stocks-Carrington framework (TTF) for model based testing (MBT). The resulting pro...