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150
Voted
VLSID
2007
IEEE
16 years 5 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
131
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DSD
2006
IEEE
15 years 11 months ago
2006
IEEE
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
154
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ERLANG
2004
ACM
15 years 10 months ago
2004
ACM
Testing of software components during development is a heavily used approach to detect programming errors and to evaluate the quality of software. Systematic approaches to softwar...
124
Voted
ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of ...
132
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EUROGP
2003
Springer
15 years 10 months ago
2003
Springer
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...