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ICCD
2003
IEEE
113views Hardware» more  ICCD 2003»
15 years 11 months ago
Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
BMCBI
2006
79views more  BMCBI 2006»
15 years 6 months ago
The effects of multiple features of alternatively spliced exons on the KA/KS ratio test
Background: The evolution of alternatively spliced exons (ASEs) is of primary interest because these exons are suggested to be a major source of functional diversity of proteins. ...
Feng-Chi Chen, Trees-Juen Chuang
ICES
2010
Springer
106views Hardware» more  ICES 2010»
15 years 4 months ago
The Use of Genetic Algorithm to Reduce Power Consumption during Test Application
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Jaroslav Skarvada, Zdenek Kotásek, Josef St...
FLAIRS
2009
15 years 3 months ago
Advanced Measures for Empirical Testing
Empirical testing is a very popular evaluation method for the development of intelligent systems. Here, previously solved problems with correct solutions are given as cases to the...
Joachim Baumeister
STOC
2003
ACM
114views Algorithms» more  STOC 2003»
16 years 6 months ago
Testing subgraphs in directed graphs
Let H be a fixed directed graph on h vertices, let G be a directed graph on n vertices and suppose that at least n2 edges have to be deleted from it to make it H-free. We show tha...
Noga Alon, Asaf Shapira