6800 search results - page 253 / 1360 » Testing with Functions as Specifications |
154
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VLSID
2002
IEEE
16 years 6 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
155
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STOC
2005
ACM
16 years 6 months ago
2005
ACM
We construct an efficient probabilistic algorithm that, given a finite set with a binary operation, tests if it is an abelian group. The distance used is an analogue of the edit d...
172
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STACS
2009
Springer
16 years 24 days ago
2009
Springer
Motivated by the quantum algorithm for testing commutativity of black-box groups (Magniez and Nayak, 2007), we study the following problem: Given a black-box finite ring by an add...
143
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DATE
2006
IEEE
16 years 3 days ago
2006
IEEE
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
141
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COCO
2005
Springer
15 years 11 months ago
2005
Springer
A property tester with high probability accepts inputs satisfying a given property and rejects inputs that are far from satisfying it. A tolerant property tester, as defined by P...