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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
15 years 10 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
IAAI
2001
15 years 7 months ago
Constraint-Based Modeling of InterOperability Problems Using an Object-Oriented Approach
ADIOP is an application for Automated Diagnosis of InterOperability Problems. Interoperability testing involves checking the degree of compatibility between two networking devices...
Mohammed H. Sqalli, Eugene C. Freuder
SIGSOFT
2008
ACM
16 years 6 months ago
Profile-guided program simplification for effective testing and analysis
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
Lingxiao Jiang, Zhendong Su
EVOW
2001
Springer
15 years 10 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
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AIME
2009
Springer
15 years 10 months ago
Data-Efficient Information-Theoretic Test Selection
We use the concept of conditional mutual information (MI) to approach problems involving the selection of variables in the area of medical diagnosis. Computing MI requires estimate...
Marianne Mueller, Rómer Rosales, Harald Ste...