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ICSEA
2009
IEEE
16 years 1 months ago
Testing of Image Processing Algorithms on Synthetic Data
—In this paper, it is shown that synthetic images can be used to test specific use cases of a lane tracking algorithm which has been developed by Audi AG. This was achieved by s...
Kilian von Neumann-Cosel, Erwin Roth, Daniel Lehma...
AIME
2007
Springer
16 years 1 months ago
On the Behaviour of Information Measures for Test Selection
In diagnostic decision-support systems, a test-selection facility serves to select tests that are expected to yield the largest decrease in the uncertainty about a patient’s diag...
Danielle Sent, Linda C. van der Gaag
BVAI
2005
Springer
16 years 14 days ago
Incomplete Contour Representations and Shape Descriptors: ICR Test Studies
Inspired by psychophysical studies of the human cognitive abilities we propose a novel aspect and a method for performance evaluation of contour based shape recognition algorithms ...
Anarta Ghosh, Nicolai Petkov
ASPDAC
2004
ACM
112views Hardware» more  ASPDAC 2004»
16 years 14 days ago
Longest path selection for delay test under process variation
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
16 years 9 days ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...