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VTS
2002
IEEE
109views Hardware» more  VTS 2002»
15 years 12 months ago
Controlling Peak Power During Scan Testing
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
Ranganathan Sankaralingam, Nur A. Touba
195
Voted
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
15 years 12 months ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
JAVACARD
2000
15 years 10 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
HIS
2004
15 years 8 months ago
GAP Test: A Cognitive Evaluation Procedure for Shape Descriptors
With inspiration from psychophysical researches of the human visual system we propose a novel method for performance evaluation of contour based shape recognition algorithms. We u...
Anarta Ghosh, Nicolai Petkov
IPMI
2009
Springer
15 years 11 months ago
Discovering Sparse Functional Brain Networks Using Group Replicator Dynamics (GRD)
Functional magnetic resonance imaging (fMRI) has become increasingly used for studying functional integration of the brain. However, the large inter-subject variability in function...
Bernard Ng, Rafeef Abugharbieh, Martin J. McKeown