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ICCAD
1995
IEEE
94views Hardware» more  ICCAD 1995»
15 years 3 months ago
Test register insertion with minimum hardware cost
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
Albrecht P. Stroele, Hans-Joachim Wunderlich
ICSE
2005
IEEE-ACM
15 years 11 months ago
A framework of greedy methods for constructing interaction test suites
Greedy algorithms for the construction of software interaction test suites are studied. A framework is developed to evaluate a large class of greedy methods that build suites one ...
Charles J. Colbourn, Myra B. Cohen, Renée C...
SODA
2010
ACM
157views Algorithms» more  SODA 2010»
15 years 9 months ago
Testing monotone high-dimensional distributions
A monotone distribution P over a (partially) ordered domain assigns higher probability to y than to x if y x in the order. We study several natural problems concerning testing pr...
Ronitt Rubinfeld, Rocco A. Servedio
DATE
2008
IEEE
122views Hardware» more  DATE 2008»
15 years 6 months ago
Digital bit stream jitter testing using jitter expansion
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
Hyun Choi, Abhijit Chatterjee
COMPSAC
2004
IEEE
15 years 3 months ago
Web Application Bypass Testing
Input validation refers to checking user inputs to a program to ensure that they conform to expectations of the program. Input validation is used to check the format of numbers and...
Jeff Offutt, Ye Wu, Xiaochen Du, Hong Huang