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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 1 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
SFP
2003
14 years 10 months ago
Testing reactive systems with GAST
G∀ST is a fully automatic test system. Given a logical property, stated as a function, it is able to generate appropriate test values, to execute tests with these values, and to ...
Pieter W. M. Koopman, Rinus Plasmeijer
MAM
2008
138views more  MAM 2008»
14 years 9 months ago
FPGA based tester tool for hybrid real-time systems
This paper presents a design methodology for a hybrid Hardwarein-the-Loop (HIL) tester tool, based on both discrete event system theory, given by timed automata, and continuous sy...
Jan Krakora, Zdenek Hanzálek
TAP
2008
Springer
102views Hardware» more  TAP 2008»
14 years 9 months ago
A Logic-Based Approach to Combinatorial Testing with Constraints
Abstract. Usage of combinatorial testing is wide spreading as an effective technique to reveal unintended feature interaction inside a given system. To this aim, test cases are con...
Andrea Calvagna, Angelo Gargantini
81
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ICFEM
2007
Springer
15 years 1 months ago
Testing for Refinement in CSP
Abstract. CSP is a well-established formalism for modelling and verification of concurrent reactive systems based on refinement. Consolidated denotational models and an effective t...
Ana Cavalcanti, Marie-Claude Gaudel