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DAC
2003
ACM
16 years 3 days ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
DAC
2006
ACM
16 years 3 days ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
WWW
2008
ACM
15 years 11 months ago
Online auctions efficiency: a survey of ebay auctions
Online auctions have become a pervasive transaction mechanism for e-commerce. As the largest online marketplace in the world, eBay is an attractive case study that enables the stu...
Wenyan Hu, Alvaro Bolivar
WWW
2008
ACM
15 years 11 months ago
Graph theoretical framework for simultaneously integrating visual and textual features for efficient web image clustering
With the explosive growth of Web and the recent development in digital media technology, the number of images on the Web has grown tremendously. Consequently, Web image clustering...
Manjeet Rege, Ming Dong, Jing Hua
WWW
2008
ACM
15 years 11 months ago
Knowledge sharing and yahoo answers: everyone knows something
Yahoo Answers (YA) is a large and diverse question-answer forum, acting not only as a medium for sharing technical knowledge, but as a place where one can seek advice, gather opin...
Lada A. Adamic, Jun Zhang, Eytan Bakshy, Mark S. A...