Sciweavers

2695 search results - page 102 / 539
» The Complexity of Forecast Testing
Sort
View
VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
15 years 10 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
ICS
1993
Tsinghua U.
15 years 2 months ago
Static and Dynamic Evaluation of Data Dependence Analysis
—Data dependence analysis techniques are the main component of today’s strategies for automatic detection of parallelism. Parallelism detection strategies are being incorporate...
Paul Petersen, David A. Padua
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
15 years 3 months ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu...
FATES
2003
Springer
15 years 3 months ago
Auto-generating Test Sequences Using Model Checkers: A Case Study
Use of model-checking approaches for test generation from requirement models have been proposed by several researchers. These approaches leverage the witness (or counter-example) ...
Mats Per Erik Heimdahl, Sanjai Rayadurgam, Willem ...
JSS
2010
104views more  JSS 2010»
14 years 4 months ago
Using hybrid algorithm for Pareto efficient multi-objective test suite minimisation
Test suite minimisation techniques seek to reduce the effort required for regression testing by selecting a subset of test suites. In previous work, the problem has been considere...
Shin Yoo, Mark Harman