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» The Complexity of Forecast Testing
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IUI
2010
ACM
15 years 4 months ago
Lowering the barriers to website testing with CoTester
In this paper, we present CoTester, a system designed to decrease the difficulty of testing web applications. CoTester allows testers to create test scripts that are represented ...
Jalal Mahmud, Tessa Lau
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 3 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
COMPSAC
1999
IEEE
15 years 2 months ago
Testing Extensible Design Patterns in Object-Oriented Frameworks through Scenario Templates
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
Wei-Tek Tsai, Yongzhong Tu, Weiguang Shao, Ezra Eb...
DATE
1999
IEEE
147views Hardware» more  DATE 1999»
15 years 2 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
DELTA
2004
IEEE
15 years 1 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi