2695 search results - page 108 / 539 » The Complexity of Forecast Testing |
130
Voted
KBSE
2008
IEEE
15 years 10 months ago
2008
IEEE
One activity performed by developers during regression testing is test-suite augmentation, which consists of assessing the adequacy of a test suite after a program is modified an...
118
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
136
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
122
Voted
ICECCS
1997
IEEE
15 years 8 months ago
1997
IEEE
Software architectures can play a role in improving the testing process of complex systems. In particular, descriptions of the software architecture can be useful to drive integra...
154
Voted
ICCAD
1995
IEEE
15 years 7 months ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...