2695 search results - page 34 / 539 » The Complexity of Forecast Testing |
DDECS
2007
IEEE
15 years 4 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
FCT
2007
Springer
15 years 3 months ago
2007
Springer
We present quantum query complexity bounds for testing algebraic properties. For a set S and a binary operation on S, we consider the decision problem whether S is a semigroup or ...
ECAI
2008
Springer
14 years 11 months ago
2008
Springer
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...
APPROX
2009
Springer
15 years 4 months ago
2009
Springer
Referring to the query complexity of property testing, we prove the existence of a rich hierarchy of corresponding complexity classes. That is, for any relevant function q, we prov...
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TVLSI
2008
14 years 9 months ago
2008
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transis...