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» The Complexity of Forecast Testing
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DATE
2006
IEEE
108views Hardware» more  DATE 2006»
15 years 3 months ago
Automatic march tests generations for static linked faults in SRAMs
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Gi...
DATE
2010
IEEE
149views Hardware» more  DATE 2010»
15 years 2 months ago
Efficient decision ordering techniques for SAT-based test generation
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
Mingsong Chen, Xiaoke Qin, Prabhat Mishra
CDC
2008
IEEE
114views Control Systems» more  CDC 2008»
14 years 11 months ago
Dynamic test selection for reconfigurable diagnosis
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...
Mattias Krysander, Fredrik Heintz, Jacob Roll, Eri...
SAC
2008
ACM
14 years 9 months ago
PHALANX: a graph-theoretic framework for test case prioritization
Test case prioritization for regression testing can be performed using different metrics (e.g., statement coverage, path coverage) depending on the application context. Employing ...
Murali Krishna Ramanathan, Mehmet Koyutürk, A...
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
15 years 3 months ago
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...
Alexandre M. Amory, Marcelo Lubaszewski, Fernando ...