2695 search results - page 82 / 539 » The Complexity of Forecast Testing |
ETS
2007
IEEE
15 years 4 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
CSEE
2007
Springer
15 years 4 months ago
2007
Springer
Many university classes and commercial training courses rely on classroom lecture and practice exercises to help students learn new skills. The thesis work described in this paper...
HT
2004
ACM
15 years 3 months ago
2004
ACM
The SMIL 2.0 Language profile support several mechanisms for controlling interactivity in a SMIL 2.0 presentation. Unfortunately, the SMIL standard testset does not verify complex...
DATE
2004
IEEE
15 years 1 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
ET
2000
14 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...