2695 search results - page 84 / 539 » The Complexity of Forecast Testing |
MTDT
2003
IEEE
15 years 3 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
ITC
2002
IEEE
15 years 2 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
PTS
2007
14 years 11 months ago
2007
Abstract. We propose an extension of the Finite State Machine framework in distributed systems, using input/output partial order automata (IOPOA). In this model, transitions can be...
HIS
2004
14 years 11 months ago
2004
: A-scans from ultrasonic testing of long shafts are complex signals. The discrimination of different types of echoes is of importance for non-destructive testing and equipment mai...
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ET
2006
14 years 9 months ago
2006
In this paper, an optimization methodology is used to select the locations and characteristics of test, diagnosis and rework operations in electronic systems assembly processes. Re...