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DAC
2005
ACM
16 years 1 months ago
Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
DAC
2005
ACM
16 years 1 months ago
Multilevel full-chip routing for the X-based architecture
As technology advances into the nanometer territory, the interconnect delay has become a first-order effect on chip performance. To handle this effect, the X-architecture has been...
Tsung-Yi Ho, Chen-Feng Chang, Yao-Wen Chang, Sao-J...
DAC
2005
ACM
16 years 1 months ago
Flexible ASIC: shared masking for multiple media processors
ASIC provides more than an order of magnitude advantage in terms of density, speed, and power requirement per gate. However, economic (cost of masks) and technological (deep micro...
Jennifer L. Wong, Farinaz Koushanfar, Miodrag Potk...
DAC
2006
ACM
16 years 1 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
131
Voted
DAC
2006
ACM
16 years 1 months ago
High-level power management of embedded systems with application-specific energy cost functions
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
Youngjin Cho, Naehyuck Chang, Chaitali Chakrabarti...
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