5005 search results - page 140 / 1001 » The Design and Analysis of Parallel Algorithms |
84
Voted
ASPDAC
2001
ACM
15 years 4 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
133
Voted
BPM
2006
Springer
15 years 4 months ago
2006
Springer
Mining, discovering, and integrating process-oriented services has attracted growing attention in the recent year. Workflow precedence graph and workflow block structures are two i...
97
Voted
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
100
Voted
DNA
2004
Springer
15 years 4 months ago
2004
Springer
To design DNA nano-machines or analyze DNA molecular reactions, it is important to be able to predict the energy landscape of molecular structures and the energy barrier of a trans...
IPPS
2009
IEEE
15 years 7 months ago
2009
IEEE
—Particle Swarm Optimisation (PSO) is increasingly being applied to optimisation of multi-objective problems in engineering design and scientific investigation. This paper inves...