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» The Design and Optimization of SOC Test Solutions
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DFT
2003
IEEE
113views VLSI» more  DFT 2003»
15 years 2 months ago
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 3 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
ICCAD
2002
IEEE
146views Hardware» more  ICCAD 2002»
15 years 6 months ago
Test-model based hierarchical DFT synthesis
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, ...
IOLTS
2008
IEEE
112views Hardware» more  IOLTS 2008»
15 years 3 months ago
A Modular Memory BIST for Optimized Memory Repair
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Most of the existing built-in self-repair solutions reuse IP-C...
Philipp Öhler, Alberto Bosio, Giorgio Di Nata...
VLSID
2008
IEEE
138views VLSI» more  VLSID 2008»
15 years 10 months ago
Memory Architecture Exploration Framework for Cache Based Embedded SOC
Today's feature-rich multimedia products require embedded system solution with complex System-on-Chip (SoC) to meet market expectations of high performance at a low cost and l...
T. S. Rajesh Kumar, C. P. Ravikumar, R. Govindaraj...