158 search results - page 8 / 32 » The Effect of Testing on Reliability of Fault-Tolerant Softw... |
CODES
2010
IEEE
14 years 6 months ago
2010
IEEE
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
LCTRTS
2010
Springer
14 years 7 months ago
2010
Springer
Chip multiprocessors (CMPs) are expected to be the building blocks for future computer systems. While architecting these emerging CMPs is a challenging problem on its own, program...
MICRO
2009
IEEE
15 years 4 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...