Testing complex manufacturing systems, such as an ASML [1] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be execu...
R. Boumen, I. S. M. de Jong, J. W. H. Vermunt, J. ...
Detailed or cycle-accurate/bit-accurate (CABA) simulation is a critical phase in the design flow of embedded systems. However, with increasing system complexity, full detailed sim...
—The realistic performance of a multi-input multi-output (MIMO) communication system depends strongly on the spatial correlation properties introduced by clustering in the propag...
In this paper, we propose a novel and general approach for time-series data mining. As an alternative to traditional ways of designing specific algorithm to mine certain kind of ...
Yi Wang, Lizhu Zhou, Jianhua Feng, Jianyong Wang, ...
This paper presents a method to reduce the complexity of a linear or linearized (small-signal) analog circuit. The reduction technique, based on quality-error ranking, can be used...
Walter Daems, Georges G. E. Gielen, Willy M. C. Sa...