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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
151
Voted
ICSEA
2009
IEEE
15 years 11 months ago
2009
IEEE
: This paper presents an approach to model ontologies for the e-Government domain as a basis for an integrated e-Government environment. Over the last couple of years the applicati...
113
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IEEEPACT
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract—As programmers are asked to manage more complicated parallel machines, it is likely that they will become increasingly dependent on tools such as multi-threaded data rac...
126
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ISCA
2009
IEEE
15 years 11 months ago
2009
IEEE
Shared-memory multi-threaded programming is inherently more difficult than single-threaded programming. The main source of complexity is that, the threads of an application can in...
140
Voted
MICRO
2009
IEEE
15 years 11 months ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...