617 search results - page 70 / 124 » The General Architecture of Generation in ACORD |
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Bounded Model Checking (BMC) based on Boolean Satisfiability (SAT) procedures has recently gained popularity as an alternative to BDD-based model checking techniques for finding b...
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Instances of the Boolean satisfiability problem (SAT) arise in many areas of circuit design and verification. These instances are typically constructed from some human-designed ar...
DAC
2004
ACM
15 years 10 months ago
2004
ACM
A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also cau...
DAC
2004
ACM
15 years 10 months ago
2004
ACM
Scratch-pad memories (SPMs) enable fast access to time-critical data. While prior research studied both static and dynamic SPM management strategies, not being able to keep all ho...
DAC
2005
ACM
15 years 10 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...