Sciweavers

4107 search results - page 100 / 822
» The Generalized Lambda Test
Sort
View
ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
15 years 10 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
104
Voted
IUI
2010
ACM
15 years 8 months ago
Lowering the barriers to website testing with CoTester
In this paper, we present CoTester, a system designed to decrease the difficulty of testing web applications. CoTester allows testers to create test scripts that are represented ...
Jalal Mahmud, Tessa Lau
ISSTA
2006
ACM
15 years 7 months ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 7 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
ITC
2003
IEEE
134views Hardware» more  ITC 2003»
15 years 6 months ago
Effectiveness Improvement of ECR Tests
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Wanli Jiang, Erik Peterson, Bob Robotka