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AMOST
2005
ACM
15 years 7 months ago
Using information about functions in selecting test cases
We consider the problem of generating a set of test cases from a black box specification. We focus on stress testing, i.e. picking test cases that seem most likely to reveal prog...
Markus Clermont, David Lorge Parnas
ISLPED
2005
ACM
68views Hardware» more  ISLPED 2005»
15 years 7 months ago
Two efficient methods to reduce power and testing time
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
Il-soo Lee, Tony Ambler
DAC
2003
ACM
15 years 6 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
DAC
2004
ACM
15 years 5 months ago
On test generation for transition faults with minimized peak power dissipation
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
Wei Li, Sudhakar M. Reddy, Irith Pomeranz
ECAI
2006
Springer
15 years 5 months ago
Testing the Limits of Emergent Behavior in MAS Using Learning of Cooperative Behavior
Abstract. We present a method to test a group of agents for (unwanted) emergent behavior by using techniques from learning of cooperative behavior. The general idea is to mimick us...
Jordan Kidney, Jörg Denzinger