64 search results - page 5 / 13 » The Impact of Silicon Photonics |
ETS
2007
IEEE
15 years 3 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
The detection of cell stability and data retention faults in SRAMs has been a time consuming process. In this paper we discuss a new design for test technique called Weak Write Tes...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Carbon Nanotube Field-Effect Transistors (CNFETs) show big promise as extensions to silicon-CMOS because: 1) Ideal CNFETs can provide significant energy and performance benefits o...
ASPLOS
2006
ACM
15 years 3 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
ISBI
2004
IEEE
15 years 10 months ago
2004
IEEE
In this contribution we introduce adaptive finite element methods for forward modeling in fluorescence optical tomography. Adaptive local mesh refinement increases the accuracy of...