Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse im...
We expect that many-core microprocessors will push performance per chip from the 10 gigaflop to the 10 teraflop range in the coming decade. To support this increased performance...
Dana Vantrease, Robert Schreiber, Matteo Monchiero...
We describe our visualization process for a particle-based simulation of the formation of the first stars and their impact on cosmic history. The dataset consists of several hundre...
Paul Arthur Navrátil, Jarrett L. Johnson, Volke...
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. St...
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...