We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P....
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
In this paper, we propose novel architectural and design techniques for three-dimensional field-programmable gate arrays (3D FPGAs) with Through-Silicon Vias (TSVs). We develop a...
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
In this work we present a predictive analytical model that encompasses the performance and scaling characteristics of a nondeterministic particle transport application, MCNP (Mont...