59 search results - page 10 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
MICRO
2008
IEEE
15 years 3 months ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
CASES
2008
ACM
14 years 11 months ago
2008
ACM
Although CMOS feature size scaling has been the source of dramatic performance gains, it has lead to mounting reliability concerns due to increasing power densities and on-chip te...
HPCA
2009
IEEE
15 years 4 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
56
Voted
DSN
2008
IEEE
15 years 4 months ago
2008
IEEE
Current technology trends of increased scale of integration are pushing CMOS technology into the deepsubmicron domain, enabling the creation of chips with a significantly greater...
MOBISYS
2010
ACM
14 years 11 months ago
2010
ACM
We present Darwin, an enabling technology for mobile phone sensing that combines collaborative sensing and classification techniques to reason about human behavior and context on ...