59 search results - page 7 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
MICRO
2010
IEEE
14 years 7 months ago
2010
IEEE
As technology scaling poses a threat to DRAM scaling due to physical limitations such as limited charge, alternative memory technologies including several emerging non-volatile me...
ICCD
2005
IEEE
15 years 6 months ago
2005
IEEE
As technology scales, power consumption and thermal effects have become challenges for system-on-chip designers. The rising on-chip temperatures can have negative impacts on SoC p...
GLVLSI
2008
IEEE
15 years 4 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
TCAD
2002
14 years 9 months ago
2002
This paper introduces an accurate analysis of on-chip inductance effects for distributed interconnects that takes the effect of both the series resistance and the output parasitic ...
92
Voted
ISQED
2011
IEEE
14 years 1 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...