59 search results - page 9 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal e ects impact a...
TC
2011
14 years 4 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...
79
Voted
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
With technology advances, the number of cores integrated on a chip and their speed of operation is increasing. This, in turn is leading to a significant increase in chip temperat...