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ICML
2001
IEEE
15 years 10 months ago
Constrained K-means Clustering with Background Knowledge
Clustering is traditionally viewed as an unsupervised method for data analysis. However, in some cases information about the problem domain is available in addition to the data in...
Kiri Wagstaff, Claire Cardie, Seth Rogers, Stefan ...
VLSID
2005
IEEE
116views VLSI» more  VLSID 2005»
15 years 10 months ago
A Quasi-Delay-Insensitive Method to Overcome Transistor Variation
Synchronous design methods have intrinsic performance overheads due to their use of the global clock and timing assumptions. In future manufacturing processes not only may it beco...
C. Brej, Jim D. Garside
CADE
2007
Springer
15 years 10 months ago
Predictive Labeling with Dependency Pairs Using SAT
This paper combines predictive labeling with dependency pairs and reports on its implementation. Our starting point is the method of proving termination of rewrite systems using se...
Adam Koprowski, Aart Middeldorp
ICSE
2005
IEEE-ACM
15 years 10 months ago
Check 'n' crash: combining static checking and testing
We present an automatic error-detection approach that combines static checking and concrete test-case generation. Our approach consists of taking the abstract error conditions inf...
Christoph Csallner, Yannis Smaragdakis
ICCD
2008
IEEE
157views Hardware» more  ICCD 2008»
15 years 7 months ago
Power-aware soft error hardening via selective voltage scaling
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Kai-Chiang Wu, Diana Marculescu