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DAC
2005
ACM
14 years 11 months ago
Logic soft errors in sub-65nm technologies design and CAD challenges
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
RAID
2010
Springer
14 years 8 months ago
On Challenges in Evaluating Malware Clustering
Malware clustering and classification are important tools that enable analysts to prioritize their malware analysis efforts. The recent emergence of fully automated methods for ma...
Peng Li, Limin Liu, Debin Gao, Michael K. Reiter
CHI
2011
ACM
14 years 1 months ago
Home automation in the wild: challenges and opportunities
Visions of smart homes have long caught the attention of researchers and considerable effort has been put toward enabling home automation. However, these technologies have not bee...
A. J. Bernheim Brush, Bongshin Lee, Ratul Mahajan,...
ICPR
2004
IEEE
15 years 11 months ago
Biometrics: A Grand Challenge
Reliable person recognition is an important problem in diverse businesses. Biometrics, recognition based on distinctive personal traits, has the potential to become an irreplaceab...
Anil K. Jain, Sharath Pankanti, Salil Prabhakar, L...
WWW
2010
ACM
15 years 4 months ago
Distributing private data in challenged network environments
Developing countries face significant challenges in network access, making even simple network tasks unpleasant. Many standard techniques—caching and predictive prefetching— ...
Azarias Reda, Brian D. Noble, Yidnekachew Haile