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DAC
2007
ACM
16 years 26 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SIGSOFT
2006
ACM
16 years 18 days ago
SYNERGY: a new algorithm for property checking
We consider the problem if a given program satisfies a specified safety property. Interesting programs have infinite state spaces, with inputs ranging over infinite domains, and f...
Bhargav S. Gulavani, Thomas A. Henzinger, Yamini K...
ICDT
2009
ACM
143views Database» more  ICDT 2009»
16 years 17 days ago
Automatic construction of simple artifact-based business processes
Almost all medium- and large-scale businesses rely on electronic workflow systems to manage their business processes. A key challenge is to enable the easy re-use and modification...
Christian Fritz, Richard Hull, Jianwen Su
WWW
2004
ACM
16 years 16 days ago
Fine-grained, structured configuration management for web projects
Researchers in Web engineering have regularly noted that existing Web application development environments provide little support for managing the evolution of Web applications. K...
Tien Nhut Nguyen, Ethan V. Munson, Cheng Thao
WWW
2003
ACM
16 years 16 days ago
Haystack: A Platform for Authoring End User Semantic Web Applications
The Semantic Web promises to open innumerable opportunities for automation and information retrieval by standardizing the protocols for metadata exchange. However, just as the succ...
Dennis Quan, David Huynh, David R. Karger