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138
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ICSE
2001
IEEE-ACM
15 years 9 months ago
Fast Formal Analysis of Requirements via "Topoi Diagrams"
Early testing of requirements can decrease the cost of removing errors in software projects. However, unless done carefully, that testing process can significantly add to the cos...
Tim Menzies, John D. Powell, Michael E. Houle
IWVF
2001
Springer
15 years 9 months ago
Judging Whether Multiple Silhouettes Can Come from the Same Object
We consider the problem of recognizing an object from its silhouette. We focus on the case in which the camera translates, and rotates about a known axis parallel to the image, suc...
David W. Jacobs, Peter N. Belhumeur, Ian Jermyn
LPAR
2001
Springer
15 years 9 months ago
Local Temporal Logic is Expressively Complete for Cograph Dependence Alphabets
Abstract. Recently, local logics for Mazurkiewicz traces are of increasing interest. This is mainly due to the fact that the satisfiability problem has the same complexity as in t...
Volker Diekert, Paul Gastin
128
Voted
SACRYPT
2001
Springer
123views Cryptology» more  SACRYPT 2001»
15 years 9 months ago
Weaknesses in the Key Scheduling Algorithm of RC4
Abstract. Inthis paper we present several weaknesses in the keyscheduling algorithm of RC4, and describe their cryptanalytic signi cance. We identify a large number of weak keys, i...
Scott R. Fluhrer, Itsik Mantin, Adi Shamir
149
Voted
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
15 years 9 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...