The Local Outlier Factor (LOF) is a very powerful anomaly detection method available in machine learning and classification. The algorithm defines the notion of local outlier in...
Object localization using sensed data features and corresponding model features is a fundamental problem in machine vision. We reformulate object localization as a least squares p...
Abstract In case of insufficient data samples in highdimensional classification problems, sparse scatters of samples tend to have many ‘holes’—regions that have few or no nea...
Hakan Cevikalp, Diane Larlus, Marian Neamtu, Bill ...
This paper studies image alignment, the problem of learning a shape and appearance model from labeled data and efficiently fitting the model to a non-rigid object with large varia...
Xiaoming Liu 0002, Ting Yu, Thomas Sebastian, Pete...
We describe a method designed to detect fluorescent rods from 2D microscopy images. It is motivated by the desire to study the dynamics of bacteria such as Shigella. The methodolo...
Bo Zhang, Jost Enninga, Jean-Christophe Olivo-Mari...