ABSTRACT { Sub-micron technologies and the increasing size and complexity of integrated components have aggravated the eect of long interconnects and buses, compared to that of ga...
Motivated by the increasing need to handle complex multidimensional data in location-based data warehouses, this paper proposes a powerful data model that is able to capture the c...
This paper addresses the problem of fine-grained data replication in large distributed systems, such as the Internet, so as to minimize the user access delays. With fine-grained d...
Power consumption within the memory hierarchy grows in importance as on-chip data caches occupy increasingly greater die area. Among dynamic power conservation schemes, horizontal...
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...