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EXPCS
2007
15 years 1 months ago
Measuring performance, power, and temperature from real processors
The modeling of power and thermal behavior of processors requires challenging validation processes, which may be complex and undependable. In order to ameliorate some of the diffi...
Francisco J. Mesa-Martinez, Michael Brown, Joseph ...
ISCAS
2008
IEEE
122views Hardware» more  ISCAS 2008»
15 years 3 months ago
A nano-CMOS process variation induced read failure tolerant SRAM cell
— In a nanoscale technology, memory bits are highly susceptible to process variation induced read/write failures. To address the above problem, in this paper a new memory cell is...
Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhi...
ICIP
2001
IEEE
15 years 11 months ago
Motion estimation for low power video devices
We propose a block motion estimation (ME) algorithm that meets high quality requirements and allows for cost efficient VLSI realizations. It relies on a set of rules common to all...
Christophe De Vleeschouwer, Tord Nilsson
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CODES
2007
IEEE
15 years 3 months ago
On the impact of manufacturing process variations on the lifetime of sensor networks
As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of indi...
Siddharth Garg, Diana Marculescu
ADAEUROPE
2004
Springer
15 years 2 months ago
Vector Processing in Ada
Abstract. To handle signal processing algorithms such as the Fast Fourrier Transform (FFT) or the Discrete Cosine Transform (DCT) system designers have traditionally resorted to sp...
Franco Gasperoni