3806 search results - page 712 / 762 » The Power of Process |
128
click to vote
ISESE
2006
IEEE
15 years 10 months ago
2006
IEEE
Inspection is considered a powerful method to check software documents for defects. Many published work shows that inspections in requirements specification phase are particularly...
137
click to vote
MICRO
2006
IEEE
15 years 10 months ago
2006
IEEE
One of the major issues faced by the semiconductor industry today is that of reducing chip yields. As the process technologies have scaled to smaller feature sizes, chip yields ha...
127
click to vote
CASES
2006
ACM
15 years 10 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
142
click to vote
CASES
2006
ACM
15 years 10 months ago
2006
ACM
Random access memory (RAM) is tightly-constrained in many embedded systems. This is especially true for the least expensive, lowest-power embedded systems, such as sensor network ...
138
click to vote
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Until recently, most 3D graphics applications had been regarded as too computationally intensive for devices other than desktop computers and gaming consoles. This notion is rapid...