5990 search results - page 1000 / 1198 » The Sampling Analysis Pattern |
VLSID
2001
IEEE
15 years 11 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
160
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SIGMOD
2007
ACM
15 years 11 months ago
2007
ACM
Many database applications require the analysis and processing of data streams. In such systems, huge amounts of data arrive rapidly and their values change over time. The variati...
116
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SIGMOD
2004
ACM
15 years 11 months ago
2004
ACM
Mining informative patterns from very large, dynamically changing databases poses numerous interesting challenges. Data summarizations (e.g., data bubbles) have been proposed to c...
EUROSYS
2007
ACM
15 years 8 months ago
2007
ACM
The major chip manufacturers have all introduced chip multiprocessing (CMP) and simultaneous multithreading (SMT) technology into their processing units. As a result, even low-end...
ICCAD
2003
IEEE
15 years 7 months ago
2003
IEEE
— Memory-intensive applications present unique challenges to an ASIC designer in terms of the choice of memory organization, memory size requirements, bandwidth and access latenc...