5990 search results - page 1040 / 1198 » The Sampling Analysis Pattern |
SLIP
2006
ACM
15 years 4 months ago
2006
ACM
Manufacturable design requires matching of interconnects which have equal nominal dimensions. New design rules are projected to bring guarantee rules for interconnect matching. In...
ACSC
2005
IEEE
15 years 4 months ago
2005
IEEE
The data mining inspired problem of finding the critical, and most useful features to be used to classify a data set, and construct rules to predict the class of future examples ...
CRV
2005
IEEE
15 years 4 months ago
2005
IEEE
We present an object detection system that is applied to detecting pedestrians in still images, without assuming any a priori knowledge about the image. The system works as follow...
CSB
2005
IEEE
15 years 4 months ago
2005
IEEE
One of the major challenges in cancer diagnosis from microarray data is to develop robust classification models which are independent of the analysis techniques used and can combi...
GLVLSI
2005
IEEE
15 years 4 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...