Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Although it is usually assumed in many pattern recognition problems that different patterns are distinguishable, some patterns may have inseparable overlap. For example, some faci...
As a learning method support vector machine is regarded as one of the best classifiers with a strong mathematical foundation. On the other hand, evolutionary computational techniq...
The change history of a software project contains a rich collection of code changes that record previous development experience. Changes that fix bugs are especially interesting, ...
In this paper, we present an easy method for automatic 3D garment pre-positioning. Given a digital 3D mannequin and a set of 2D patterns, the problem consists in sewing automatical...