911 search results - page 115 / 183 » The Semantics of Event Prevention |
IMSCCS
2007
IEEE
15 years 4 months ago
2007
IEEE
In radiation environments, alpha particles, cosmic rays and solar wind flux can cause a single event upset (SEU), which is one of the major sources of bit-flips in digital electro...
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AINA
2006
IEEE
15 years 4 months ago
2006
IEEE
— In today’s service market the provisioning of high quality services has become a critical issue for providers as the business success of their customers is often based on the...
DSN
2006
IEEE
15 years 4 months ago
2006
IEEE
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
HICSS
2005
IEEE
15 years 3 months ago
2005
IEEE
Every day, businesses are threatened by crises that could have been prevented or their impact lessened if only knowledge of causal and influencing factors were known and better ma...
WMASH
2004
ACM
15 years 3 months ago
2004
ACM
Wireless networked embedded terminals like personal digital assistants, cell-phones or sensor nodes are typically memory constrained devices. This limitation prevents the developm...