1272 search results - page 45 / 255 » The Set Cover with Pairs Problem |
102
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DAC
2009
ACM
15 years 7 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
115
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ICST
2010
IEEE
14 years 11 months ago
2010
IEEE
—Mutation testing measures the adequacy of a test suite by seeding artificial defects (mutations) into a program. If a test suite fails to detect a mutation, it may also fail to...
101
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SIAMCOMP
2008
15 years 19 days ago
2008
We prove semi-logarithmic inapproximability for a maximization problem called unique coverage: given a collection of sets, find a subcollection that maximizes the number of elemen...
147
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CISC
2009
Springer
14 years 10 months ago
2009
Springer
Abstract. Certificateless cryptography introduced by Al-Riyami and Paterson eliminates the key escrow problem inherent in identity based cryptosystems. Even though building practic...
117
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SP
2006
IEEE
15 years 6 months ago
2006
IEEE
Recently several researchers and practitioners have begun to address the problem of how to set up secure communication between two devices without the assistance of a trusted thir...