8468 search results - page 1493 / 1694 » The Technology of Data Stashing |
92
Voted
DSN
2011
IEEE
13 years 10 months ago
2011
IEEE
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
89
Voted
EMMCVPR
2011
Springer
13 years 10 months ago
2011
Springer
The challenge of recovering the topology of massive neuronal circuits can potentially be met by high throughput Electron Microscopy (EM) imagery. Segmenting a 3-dimensional stack o...
VIS
2007
IEEE
16 years 4 days ago
2007
IEEE
Abstract-- This paper describes a novel method for creating surface models of multi-material components using dual energy computed tomography (DECT). The application scenario is me...
DAC
2007
ACM
15 years 12 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
WWW
2009
ACM
15 years 11 months ago
2009
ACM
E-commerce is growing at an exponential rate. In the last decade, there has been an explosion of online commercial activity enabled by World Wide Web (WWW). These days, many consu...