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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 10 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
KBSE
2005
IEEE
15 years 11 months ago
Testing in resource constrained execution environments
Software for resource constrained embedded devices is often implemented in the Java programming language because the Java compiler and virtual machine provide enhanced safety, por...
Gregory M. Kapfhammer, Mary Lou Soffa, Daniel Moss...
ICCAD
2006
IEEE
116views Hardware» more  ICCAD 2006»
16 years 2 months ago
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
Erkan Acar, Sule Ozev, Kevin B. Redmond
ISCAS
1999
IEEE
105views Hardware» more  ISCAS 1999»
15 years 10 months ago
Configuration self-test in FPGA-based reconfigurable systems
An FPGA-based reconfigurable system may contain boards of FPGAs which are reconfigured for different applications and must work correctly. This paper presents a novel approach for...
W. Quddus, Abhijit Jas, Nur A. Touba
OOPSLA
2001
Springer
15 years 10 months ago
Regression Test Selection for Java Software
Regression testing is applied to modified software to provide confidence that the changed parts behave as intended and that the unchanged parts have not been adversely affected ...
Mary Jean Harrold, James A. Jones, Tongyu Li, Dong...