4305 search results - page 10 / 861 » The Test of Time |
ISSRE
2003
IEEE
15 years 5 months ago
2003
IEEE
Testing is often performed frequently during development to ensure software reliability by catching regression errors quickly. However, stopping frequently to test also wastes tim...
94
Voted
JDCTA
2010
14 years 6 months ago
2010
Performance indexes of the embedded real-time operating system are not isolated but interacting with each other. Two sets of elements aiming to describe the relationship between t...
DATE
2007
IEEE
15 years 6 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
DATE
1999
IEEE
15 years 4 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
79
Voted
DATE
2005
IEEE
15 years 5 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...