4305 search results - page 115 / 861 » The Test of Time |
161
click to vote
VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
160
click to vote
ICCAD
1999
IEEE
15 years 10 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
154
click to vote
VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
147
click to vote
ISQED
2010
IEEE
15 years 11 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
168
click to vote
ICSM
2009
IEEE
16 years 22 days ago
2009
IEEE
The goal of a load test is to uncover functional and performance problems of a system under load. Performance problems refer to the situations where a system suffers from unexpect...